Academic And Industrial R&D Inspection System
JadeSurf - Micro Profiling System
JadeSurf is an inspection system that transmits light slices to a specific depth. It solves the problem of the interference of scattered light from the upper and lower layers of the current white light AOI and provides a three-dimensional high-speed measurement solution. A non-destructive approach without pre-treatment directly depicts the three-dimensional appearance and roughness of the surface micro-area, which can be compared to optical AFM. At the same time, the detection of the intermediate layer of transparent materials overcomes the limitation of traditional optics. By directly capturing high-resolution images, various flaws and defects can be observed.
In the future, in response to the development trend of the industry and the requirement on the speed for large-area inspection, a high-speed hybrid confocal solution will be proposed, so that the next generation of technology will continue to contribute to solving the pains of related industries.